統計資料
總造訪次數
| 檢視 | |
|---|---|
| A new approach to simulating n-MOSFET gate current degradation by including hot-electron induced oxide damage | 113 |
本月總瀏覽
檔案下載
| 檢視 | |
|---|---|
| 000076754800012.pdf | 21 |
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 98 |
| 美國 | 14 |
| 愛爾蘭 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Kensington | 5 |
| Menlo Park | 5 |
| Beijing | 2 |
| Edmond | 2 |
| Kirksville | 1 |
| University Park | 1 |