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dc.contributor.authorWang, SYen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:01:29Z-
dc.date.available2014-12-08T15:01:29Z-
dc.date.issued1997-09-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/11536/318-
dc.description.abstract8-12 mu m InGaAs/GaAs quantum well infrared photodetectors with two different well doping concentrations have been studied. The devices with and without surface gratings are compared for normal incident operation. It is found that the TE to TM absorption ratio depends on the doping density in the quantum wells. A higher doping density increases TE absorption.:A detectivity about 1 x 10(10) cm Hz(1/2)/W and a peak responsivity of 0.23 A/W at 9 mu m have been obtained for the grating-free devices. (C) 1997 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleDoping effect on normal incident InGaAs/GaAs long-wavelength quantum well infrared photodetectorsen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume82en_US
dc.citation.issue5en_US
dc.citation.spage2680en_US
dc.citation.epage2683en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1997XT82100095-
dc.citation.woscount9-
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