Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shih, Che-Hua | en_US |
dc.contributor.author | Yang, Ya-Ching | en_US |
dc.contributor.author | Yen, Chia-Chih | en_US |
dc.contributor.author | Huang, Juinn-Dar | en_US |
dc.contributor.author | Jou, Jing-Yang | en_US |
dc.date.accessioned | 2014-12-08T15:48:25Z | - |
dc.date.available | 2014-12-08T15:48:25Z | - |
dc.date.issued | 2010-09-01 | en_US |
dc.identifier.issn | 1016-2364 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/32251 | - |
dc.description.abstract | Verifying whether a building block conforms to a specific interface protocol is one of the important steps in a platform-based system-on-a-chip design methodology. There are limitations for most of the existing methods for interface protocol compliance verification. Simulation-based methods have the false positive problem while formal property checking methods may suffer from memory explosion and excessive runtime. In this paper, we propose a novel approach for interface protocol compliance verification. The properties of the interface protocol are first specified as a specification FSM. Then the compliance of interface logic is formally verified at the higher FSM level so that the required memory and runtime can be greatly reduced. Finally, it is shown theoretically and experimentally that the proposed algorithm possesses acceptably low time complexity for practical applications. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | interface compliance verification | en_US |
dc.subject | functional verification | en_US |
dc.subject | formal verification | en_US |
dc.subject | platform-based design methodology | en_US |
dc.subject | protocol modeling | en_US |
dc.title | FSM-Based Formal Compliance Verification of Interface Protocols | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF INFORMATION SCIENCE AND ENGINEERING | en_US |
dc.citation.volume | 26 | en_US |
dc.citation.issue | 5 | en_US |
dc.citation.spage | 1601 | en_US |
dc.citation.epage | 1617 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000282396700003 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.