標題: Scan-chain reordering for minimizing scan-shift power based on non-specified test cubes
作者: Wu, Yu-Ze
Chao, Mango C. -T.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2008
摘要: This paper proposes a scan-cell reordering scheme, named ROBPR, to reduce the signal transitions during test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scheme utilizes both response correlation and pattern correlation to simultaneously minimize scan-out and scan-in transitions. A series of experiments demonstrate the effectiveness and superiority of the proposed scheme on reducing total scan-shift transitions. The trade-off between our power-driven scan-cell reordering and a routing-driven scan-cell reordering is discussed based on experiments as well.
URI: http://hdl.handle.net/11536/32309
http://dx.doi.org/10.1109/VTS.2008.16
ISBN: 978-0-7695-3123-6
ISSN: 1093-0167
DOI: 10.1109/VTS.2008.16
期刊: 26TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS
起始頁: 147
結束頁: 154
Appears in Collections:Conferences Paper


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