標題: THE EFFECT OF GRAIN-BOUNDARIES ON THE ELECTRICAL-PROPERTIES OF ZINC OXIDE-BASED VARISTOR
作者: BAI, SN
TSENG, TY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: ZNO VARISTOR;GRAIN BOUNDARY;AC RESPONSE
公開日期: 1-十一月-1992
摘要: The ac response of ZnO-based varistors was measured as a function of temperature and applied electric field. Conductivity-frequency measurements indicated that the grain boundaries of the ZnO varistors were amorphous. The device resistance was found to decrease as the temperature/applied field increased. This was attributed to deterioration of the insulating property of the grain boundaries due to generation of conduction carriers in the ZnO grains. As a large amount of these charge carriers passed through the grain boundaries, the ZnO varistors remarkably revealed a non-Debye characteristic that can be modeled by a capacitance to simulate the behavior of the grain boundaries
URI: http://dx.doi.org/10.1007/BF02665886
http://hdl.handle.net/11536/3245
ISSN: 0361-5235
DOI: 10.1007/BF02665886
期刊: JOURNAL OF ELECTRONIC MATERIALS
Volume: 21
Issue: 11
起始頁: 1073
結束頁: 1079
顯示於類別:期刊論文