標題: | Fault diagnosis of a distributed knockout switch |
作者: | Cheng, YJ Lee, TH Shen, WZ 電子工程學系及電子研究所 電信工程研究所 Department of Electronics Engineering and Institute of Electronics Institute of Communications Engineering |
關鍵字: | distributed knockout switch;fault diagnosis procedure;switch element array |
公開日期: | 1-Aug-1998 |
摘要: | The distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate. and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase. |
URI: | http://hdl.handle.net/11536/32481 |
ISSN: | 1350-2425 |
期刊: | IEE PROCEEDINGS-COMMUNICATIONS |
Volume: | 145 |
Issue: | 4 |
起始頁: | 241 |
結束頁: | 248 |
Appears in Collections: | Articles |
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