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dc.contributor.authorLin, HNen_US
dc.contributor.authorChiou, YHen_US
dc.contributor.authorChen, BMen_US
dc.contributor.authorShieh, HPDen_US
dc.contributor.authorChang, CRen_US
dc.date.accessioned2014-12-08T15:49:06Z-
dc.date.available2014-12-08T15:49:06Z-
dc.date.issued1998-05-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/11536/32632-
dc.description.abstractTwo types of 180 degrees domain walls on a 115 nm cobalt film are observed by magnetic force microscopy. The surface Neel wall on top of an asymmetric Bloch wall is found inhomogeneous. with the width estimated to be around 200 nm. The width of the rhomb-structured cross-tie wall, on the other hand, is approximately 400 nm. The coexistence of these two types of domain walls indicates that their wall energies are comparable at the film thickness. (C) 1998 American institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleMagnetic force microscopy study of domain walls on a thin cobalt filmen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume83en_US
dc.citation.issue9en_US
dc.citation.spage4997en_US
dc.citation.epage4999en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000073523900071-
dc.citation.woscount18-
Appears in Collections:Articles