标题: Built-in jitter measurement methodology for spread-spectrum clock generators
作者: Hsu, Jenchien
Chou, Maohsuan
Su, Chauchin
电控工程研究所
Institute of Electrical and Control Engineering
关键字: spread-spectrum clock;spread-spectrum clock built-in self test;jitter measurement
公开日期: 2008
摘要: In this paper, a built-in-self-test methodology for measuring frequency deviation and jitter of spread-spectrum clock generators is presented. It utilizes a phase detector to detect the clock phase of spread spectrum clock (SSC) and then measure the jitter by filtering out the low frequency component of the clock phase. Frequency of spread-spectrum clock can also be obtained by filtering out the high frequency component of the signal. The methodology is analyzed and verified with chip implementation and measurement. As an all digital design, the hardware overhead is very low.
URI: http://hdl.handle.net/11536/3386
ISBN: 978-1-4244-1616-5
期刊: 2008 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM
起始页: 67
结束页: 72
显示于类别:Conferences Paper