标题: | Built-in jitter measurement methodology for spread-spectrum clock generators |
作者: | Hsu, Jenchien Chou, Maohsuan Su, Chauchin 电控工程研究所 Institute of Electrical and Control Engineering |
关键字: | spread-spectrum clock;spread-spectrum clock built-in self test;jitter measurement |
公开日期: | 2008 |
摘要: | In this paper, a built-in-self-test methodology for measuring frequency deviation and jitter of spread-spectrum clock generators is presented. It utilizes a phase detector to detect the clock phase of spread spectrum clock (SSC) and then measure the jitter by filtering out the low frequency component of the clock phase. Frequency of spread-spectrum clock can also be obtained by filtering out the high frequency component of the signal. The methodology is analyzed and verified with chip implementation and measurement. As an all digital design, the hardware overhead is very low. |
URI: | http://hdl.handle.net/11536/3386 |
ISBN: | 978-1-4244-1616-5 |
期刊: | 2008 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM |
起始页: | 67 |
结束页: | 72 |
显示于类别: | Conferences Paper |