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dc.contributor.authorDAI, CMen_US
dc.contributor.authorCHUU, DSen_US
dc.date.accessioned2014-12-08T15:04:57Z-
dc.date.available2014-12-08T15:04:57Z-
dc.date.issued1992-03-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.350995en_US
dc.identifier.urihttp://hdl.handle.net/11536/3487-
dc.description.abstractThe transverse-optical (TO) phonon mode in a CdS film with a thickness less than 410 angstrom is observed at 4880 angstrom excitation wavelength which is above the band gap of CdS bulk (2.42 eV) at room temperature. This phenomenon is ascribed to the size quantization of the free carrier in the low-dimensional thin-film structure. The quantum size effect causes a blue shift of the band gap in the as-deposited CdS thin film. The Raman shift of the TO mode of CdS film is around 220 cm-1. The softening energy of the TO phonon mode is about 8 cm-1. It was found that this softening energy is independent of the film thickness.en_US
dc.language.isoen_USen_US
dc.titleOBSERVATION OF THE TRANSVERSE OPTICAL PHONON MODE IN CDS FILM AT 4880-A EXCITATIONen_US
dc.typeNoteen_US
dc.identifier.doi10.1063/1.350995en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume71en_US
dc.citation.issue6en_US
dc.citation.spage3056en_US
dc.citation.epage3058en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1992HJ65500095-
dc.citation.woscount4-
Appears in Collections:Articles