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dc.contributor.authorSU, DCen_US
dc.contributor.authorSHYU, LHen_US
dc.date.accessioned2014-12-08T15:05:12Z-
dc.date.available2014-12-08T15:05:12Z-
dc.date.issued1991-07-15en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://hdl.handle.net/11536/3729-
dc.description.abstractBased on the fact that the phase variation is linearly proportional to the defocusing amount of the scatter plate, the additional phase shift can be achieved by defocusing the scatter plate in a controlled manner. Consequently, a method of how the phase shifting interferometric technique can be applied to the scatter plate interferometer is described. It has both the merits of a conventional scatter plate interferometer and the phase shifting interferometric technique. The validity of this method is demonstrated.en_US
dc.language.isoen_USen_US
dc.titleA MEASURING METHOD OF A CONCAVE MIRROR BY DEFOCUSING A SCATTER PLATEen_US
dc.typeNoteen_US
dc.identifier.journalOPTICS COMMUNICATIONSen_US
dc.citation.volume84en_US
dc.citation.issue3-4en_US
dc.citation.spage109en_US
dc.citation.epage112en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:A1991FZ38100001-
dc.citation.woscount0-
顯示於類別:期刊論文