完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHIU, HT | en_US |
dc.contributor.author | WU, PF | en_US |
dc.date.accessioned | 2014-12-08T15:05:14Z | - |
dc.date.available | 2014-12-08T15:05:14Z | - |
dc.date.issued | 1991-06-01 | en_US |
dc.identifier.issn | 0009-4536 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/3777 | - |
dc.description.abstract | (Me3Si)2SiMe2, (Me3Si)3SiMe and (Me3Si)4Si were used as precursors for the deposition of polycrystalline beta-SiC thin films on silicon substrates at 1000-1200-degrees-C in a low-pressure hot-wall chemical vapor deposition reactor. The thin films were analyzed by X-ray diffraction, scanning electron microscopy and X-ray photoelectron spectroscopy. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | LOW-PRESSURE CHEMICAL VAPOR DEPOSITION | en_US |
dc.subject | ORGANOPOLYSILANES | en_US |
dc.subject | SILICON CARBIDE THIN FILMS | en_US |
dc.title | LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION OF SILICON-CARBIDE THIN-FILMS FROM ORGANOPOLYSILANES | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF THE CHINESE CHEMICAL SOCIETY | en_US |
dc.citation.volume | 38 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 231 | en_US |
dc.citation.epage | 234 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.identifier.wosnumber | WOS:A1991FR18000004 | - |
dc.citation.woscount | 5 | - |
顯示於類別: | 期刊論文 |