完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 林洋森 | en_US |
dc.contributor.author | Yang-Sem Lin | en_US |
dc.contributor.author | 周武清 | en_US |
dc.contributor.author | Wu-Ching Chou | en_US |
dc.date.accessioned | 2014-12-12T01:13:00Z | - |
dc.date.available | 2014-12-12T01:13:00Z | - |
dc.date.issued | 2007 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT009491503 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/37923 | - |
dc.description.abstract | 我們利用鉑/銀/鉑/金的金屬組合,具有高反射率及低電阻的特性,運用在p型氮化鎵歐姆接觸電極上,經過270℃熱處理之後,鉑與p型氮化鎵半導體相互擴散形成鉑-鎵合金,半導體中鎵金屬的空缺增加p型氮化鎵載子濃度,降低蕭基接面位障,使費米能階往低能量方向移動,在外加偏壓時形成良好的歐姆接觸。在電流20mA下的順向電壓值可降低至2.96V,在波長470nm的反射率也可維持在高水準86%,運用在覆晶式元件軸向光強度比傳統覆晶發光二極體元件提升36%。 | zh_TW |
dc.description.abstract | Pt/Ag/Pt/Au multiple layer structure was used as highly reflective and low-resistivity Ohmic contact to the p-type semiconductor. Under 270oC heat treatment, inter-diffusions between Pt and Ga atoms at the interface of the metal contact and the p-ype GaN occur. It results an increase in the carrier concentration in the p-type GaN and further lowers the Schottky barrier and Fermi level to form good Ohmic contact. At 20 mA injection, the turn-on voltage can be reduced to 2.96 V and the reflectivity can be maintained at 86% at 470 nm. The luminous intensity of flip-chip LED with mirror system is raised by 36% higher than that of conventional flip-chip LED. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 發光二極體 | zh_TW |
dc.subject | 氮化鎵 | zh_TW |
dc.subject | 歐姆接觸 | zh_TW |
dc.subject | 高反射 | zh_TW |
dc.subject | light emitting diode | en_US |
dc.subject | GaN | en_US |
dc.subject | ohmic contact | en_US |
dc.subject | highly reflective | en_US |
dc.title | 覆晶式發光二極體P型氮化鎵高反射鉑/銀/鉑/金歐姆電極之研究 | zh_TW |
dc.title | Highly reflective Pt/Ag/Pt/Au ohmic contacts to p-type GaN for flip-chip LED | en_US |
dc.type | Thesis | en_US |
顯示於類別: | 畢業論文 |