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dc.contributor.authorHsieh, CCen_US
dc.contributor.authorWu, CYen_US
dc.contributor.authorSun, TPen_US
dc.date.accessioned2014-12-08T15:01:32Z-
dc.date.available2014-12-08T15:01:32Z-
dc.date.issued1997-08-01en_US
dc.identifier.issn0018-9200en_US
dc.identifier.urihttp://dx.doi.org/10.1109/4.604075en_US
dc.identifier.urihttp://hdl.handle.net/11536/384-
dc.description.abstractA new current readout structure for the infrared (IR) focal-plane-array (FPA), called the switch-current integration (SCI) structure, is presented in this paper. By applying the share-buffered direct-injection (SBDI) biasing technique and off focal-plane-array (off-FPA) integration capacitor structure, a high-performance readout interface circuit for the IR FPA is realized with a pixel size of 50 x 50 mu m(2). Moreover, the correlated double sampling (CDS) stage and dynamic discharging output stage are utilized to improve noise and speed performance of the readout structure under low power dissipation. An experimental SCI readout chip has been designed and fabricated in 0.8-mu m double-poly-double-metal (DPDM) n-well CMOS technology. The measurement results of the fabricated readout chip at 77 K with 4 and 8 V supply voltages have successfully verified both the readout function and the performance improvement. The fabricated chip has a maximum charge capacity of 1.12 x 10(8) electrons, a maximum transimpedance of 1 x 10(9) Omega, and ae active power dissipation of 30 mW. The proposed CMOS SCI structure can be applied to various cryogenic IR FPA's.en_US
dc.language.isoen_USen_US
dc.subjectCMOS integrated circuiten_US
dc.subjectcryogenic electronicsen_US
dc.subjectfocal plane arrayen_US
dc.subjectreadout circuiten_US
dc.titleA new cryogenic CMOS readout structure for infrared focal plane arrayen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/4.604075en_US
dc.identifier.journalIEEE JOURNAL OF SOLID-STATE CIRCUITSen_US
dc.citation.volume32en_US
dc.citation.issue8en_US
dc.citation.spage1192en_US
dc.citation.epage1199en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
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