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dc.contributor.author周姿蒨en_US
dc.contributor.authorChou Tzu-Chienen_US
dc.contributor.author彭南夫en_US
dc.contributor.authorNan-Fu Pengen_US
dc.date.accessioned2014-12-12T01:17:23Z-
dc.date.available2014-12-12T01:17:23Z-
dc.date.issued2007en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009526519en_US
dc.identifier.urihttp://hdl.handle.net/11536/38998-
dc.description.abstract我們實際推導出一個改善管制圖的方法,首先,將每個樣本點加上本身位置的某個倍數,經過排序後的數列對應到原本的樣本資料,可以得到一組新的數列,此新的數列中會發現相鄰的兩個樣本點會產生負相關,將其特性運用至管制圖上,製成非傳統的管制圖。因為負相關使得變異數變小,在和傳統的管制圖有相同的型Ι誤差風險下,其型Ⅱ誤差風險降低,相對的提高檢定力,在製造出更多不合格品前能發現製程變異並進行改善,使產品更符合客戶的需求,藉以提升企業本身的競爭力。zh_TW
dc.language.isozh_TWen_US
dc.subject管制圖zh_TW
dc.subject負相關zh_TW
dc.subjectcontrol charten_US
dc.subjectnegative correlationen_US
dc.title改善管制圖的方法zh_TW
dc.titleA Method of Improving the Control Charten_US
dc.typeThesisen_US
dc.contributor.department統計學研究所zh_TW
Appears in Collections:Thesis


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