标题: | Surface excitation parameter for electrons crossing the A1N surface |
作者: | Kwei, C. M. Tu, Y. H. Tung, C. J. 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
关键字: | electron;surface excitation parameter;dielectric function;A1N |
公开日期: | 29-十月-2007 |
摘要: | Fast electrons crossing a solid surface induce surface excitations. The total probability of such excitations for electrons moving outside the solid, i.e. in vacuum, is characterized by the surface excitation parameter (SEP). In the present work, the SEP was calculated for either incident or escaping electrons with normal or glancing crossing angles over the surface of aluminum nitride (AlN), a wide-band-gap semiconductor. These calculations were performed based on the dielectric response theory using the sum-rule-constrained extended Drude dielectric function with parameters obtained from a fit of this function to experimental optical data and electron energy-loss data. Dependences of the SEP on electron energy and crossing angle were analyzed. A simple formula was proposed for the fitting of SEP as a function of electron energy and crossing angle. (C) 2007 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.vacuum.2007.07.028 http://hdl.handle.net/11536/3908 |
ISSN: | 0042-207X |
DOI: | 10.1016/j.vacuum.2007.07.028 |
期刊: | VACUUM |
Volume: | 82 |
Issue: | 2 |
起始页: | 197 |
结束页: | 200 |
显示于类别: | Conferences Paper |
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