標題: Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates
作者: Wu, KH
Chen, SP
Juang, JY
Uen, TM
Gou, YS
交大名義發表
電子物理學系
National Chiao Tung University
Department of Electrophysics
公開日期: 1-Aug-1997
摘要: The detailed grain evolution of (103)-oriented YBa2Cu3O7 (YBCO) films grown on as-polished and preannealed (110)SrTiO3 was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.
URI: http://dx.doi.org/10.1016/S0921-4534(97)00378-X
http://hdl.handle.net/11536/393
ISSN: 0921-4534
DOI: 10.1016/S0921-4534(97)00378-X
期刊: PHYSICA C
Volume: 282
Issue: 
起始頁: 575
結束頁: 576
Appears in Collections:Conferences Paper


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