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dc.contributor.authorChen, H. B.en_US
dc.contributor.authorDu, D. Z.en_US
dc.contributor.authorHwang, F. K.en_US
dc.date.accessioned2014-12-08T15:05:26Z-
dc.date.available2014-12-08T15:05:26Z-
dc.date.issued2007-10-01en_US
dc.identifier.issn1382-6905en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10878-007-9067-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/3974-
dc.description.abstractThis paper discusses the relation among four problems: graph testing, DNA complex screening, superimposed codes and secure key distribution. We prove a surprising equivalence relation among these four problems, and use this equivalence to improve current results on graph testing. In the rest of this paper, we give a lower bound for the minimum number of tests on DNA complex screening model.en_US
dc.language.isoen_USen_US
dc.subjectgroup testingen_US
dc.subjectpooling designsen_US
dc.subjectsuperimposed codesen_US
dc.subjectgraph testingen_US
dc.titleAn unexpected meeting of four seemingly unrelated problems: graph testing, DNA complex screening, superimposed codes and secure key distributionen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1007/s10878-007-9067-3en_US
dc.identifier.journalJOURNAL OF COMBINATORIAL OPTIMIZATIONen_US
dc.citation.volume14en_US
dc.citation.issue2-3en_US
dc.citation.spage121en_US
dc.citation.epage129en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.identifier.wosnumberWOS:000248864800003-
Appears in Collections:Conferences Paper


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