An unexpected meeting of four seemingly unrelated problems: graph testing, DNA complex screening, superimposed codes and secure key distribution

doi:10.1007/s10878-007-9067-3

Full metadata record

DC Field	Value	Language
dc.contributor.author	Chen, H. B.	en_US
dc.contributor.author	Du, D. Z.	en_US
dc.contributor.author	Hwang, F. K.	en_US
dc.date.accessioned	2014-12-08T15:05:26Z	-
dc.date.available	2014-12-08T15:05:26Z	-
dc.date.issued	2007-10-01	en_US
dc.identifier.issn	1382-6905	en_US
dc.identifier.uri	http://dx.doi.org/10.1007/s10878-007-9067-3	en_US
dc.identifier.uri	http://hdl.handle.net/11536/3974	-
dc.description.abstract	This paper discusses the relation among four problems: graph testing, DNA complex screening, superimposed codes and secure key distribution. We prove a surprising equivalence relation among these four problems, and use this equivalence to improve current results on graph testing. In the rest of this paper, we give a lower bound for the minimum number of tests on DNA complex screening model.	en_US
dc.language.iso	en_US	en_US
dc.subject	group testing	en_US
dc.subject	pooling designs	en_US
dc.subject	superimposed codes	en_US
dc.subject	graph testing	en_US
dc.title	An unexpected meeting of four seemingly unrelated problems: graph testing, DNA complex screening, superimposed codes and secure key distribution	en_US
dc.type	Article; Proceedings Paper	en_US
dc.identifier.doi	10.1007/s10878-007-9067-3	en_US
dc.identifier.journal	JOURNAL OF COMBINATORIAL OPTIMIZATION	en_US
dc.citation.volume	14	en_US
dc.citation.issue	2-3	en_US
dc.citation.spage	121	en_US
dc.citation.epage	129	en_US
dc.contributor.department	應用數學系	zh_TW
dc.contributor.department	Department of Applied Mathematics	en_US
dc.identifier.wosnumber	WOS:000248864800003	-
Appears in Collections:	Conferences Paper

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