建構一個可有效降低研發生產週期之模式─以晶圓製造廠為例

Abstract

半導體新製程技術開發是晶圓製造業的命脈，在技術與成本競爭激烈的環境中，縮短技術開發的時間並及時量產，不但是獲利的要件，更是攸關企業生存的工作，而研發單位屬於源頭的管理，因此，本研究希望藉由探討半導體廠研發單位在新製程開發、技術移轉以及進入先期量產的過程中，與工程及製造單位共用使同一Fab之資源衝突模式下，期望化解研發及Fab製造單位之間的資源衝突問題，以達公司整體績效最佳化。 本論文所發展之半導體業降低生產週期模式，係以研發專案實驗時程為基礎，採用X-factor理論來建立研發批貨績效衡量指標，依產業特性及數據資料，嘗試來建構適合的降低研發生產週期模式、達到及時量產(Time-To-Market)的目的。 本研究的貢獻在於找出研發實驗批貨生產週期的方法論、設計出績效衡量指標，依此來建構研發生產週期降低模式。模式中以X-factor指標衡量Fab在執行研發批貨上的準時達交程度，同時以創新的F-factor指標評估研發單位是否及時解決製程上的問題，並可做為研發技術移轉時的參考指標。管制衡量指標以做持續性的改善，期大幅縮短產品開發時間，提高公司的營運績效及競爭優勢。

Since both technology development and current mass production methods use the same fabrication facilities, it is the aim of this paper to probe global optimization benefits linking R&D and the Fab. The study utilizes X-factor theory to construct an R&D engineering run cycle time reduction model, using real world data to test the model. Consequently, the research can be used to shorten R&D cycle time and show Fab-run R&D Lot on-time delivery performance for new R&D technology. The company can then take advantage of these key factors thereby managing and improving operational performance in the semiconductor industry. The strategy generates a methodology that calculates R&D cycle times, designs the KPI, constructs a model for R&D cycle time reduction, and finally, to strives for continuous improvement using the SPC chart as a monitoring mechanism. The major indices used are the X-factor (XFab), which tracks a Fab''s on-time delivery performance for new R&D technology, and the F-factor which tracks new R&D technology manufacturing maturity processes and lot inventory costs.