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dc.contributor.authorHO, JHen_US
dc.contributor.authorLEE, CLen_US
dc.contributor.authorLEI, TFen_US
dc.date.accessioned2014-12-08T15:05:32Z-
dc.date.available2014-12-08T15:05:32Z-
dc.date.issued1990-08-01en_US
dc.identifier.issn0018-9456en_US
dc.identifier.urihttp://dx.doi.org/10.1109/19.57248en_US
dc.identifier.urihttp://hdl.handle.net/11536/4056-
dc.language.isoen_USen_US
dc.titleELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMSen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/19.57248en_US
dc.identifier.journalIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENTen_US
dc.citation.volume39en_US
dc.citation.issue4en_US
dc.citation.spage642en_US
dc.citation.epage648en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1990DP83600016-
dc.citation.woscount1-
Appears in Collections:Articles


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