ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	HO, JH	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	LEI, TF	en_US
dc.date.accessioned	2014-12-08T15:05:32Z	-
dc.date.available	2014-12-08T15:05:32Z	-
dc.date.issued	1990-08-01	en_US
dc.identifier.issn	0018-9456	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/19.57248	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4056	-
dc.language.iso	en_US	en_US
dc.title	ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/19.57248	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT	en_US
dc.citation.volume	39	en_US
dc.citation.issue	4	en_US
dc.citation.spage	642	en_US
dc.citation.epage	648	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1990DP83600016	-
dc.citation.woscount	1	-
顯示於類別：	期刊論文

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