MY-BOX REPRESENTATION FOR FAULTY CMOS CIRCUITS

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DC Field	Value	Language
dc.contributor.author	CHEN, JE	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	SHEN, WZ	en_US
dc.date.accessioned	2014-12-08T15:05:33Z	-
dc.date.available	2014-12-08T15:05:33Z	-
dc.date.issued	1990-06-01	en_US
dc.identifier.issn	0956-3768	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4097	-
dc.language.iso	en_US	en_US
dc.title	MY-BOX REPRESENTATION FOR FAULTY CMOS CIRCUITS	en_US
dc.type	Article	en_US
dc.identifier.journal	IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS	en_US
dc.citation.volume	137	en_US
dc.citation.issue	3	en_US
dc.citation.spage	225	en_US
dc.citation.epage	232	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1990DE42000007	-
dc.citation.woscount	0	-
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