完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 章即時 | en_US |
dc.contributor.author | Chi-Shih Chang | en_US |
dc.contributor.author | 李崇仁 | en_US |
dc.contributor.author | 蘇朝琴 | en_US |
dc.contributor.author | Chung-Len Lee | en_US |
dc.contributor.author | Chau-Chin Su | en_US |
dc.date.accessioned | 2014-12-12T01:24:59Z | - |
dc.date.available | 2014-12-12T01:24:59Z | - |
dc.date.issued | 2003 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT009067523 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/41146 | - |
dc.description.abstract | 本論文所提供的測試技術是利用數位測試機台來達成類比動態測試技術。在實作上,將三角波產生器加入到測試板上當做輸入信號。輸出波形利用PE電路的比較器做量化取樣。最後利用機率統計手法做分析,此方法可加強量化的解析度和降低受雜訊的影響。實作上所得到的實驗結果其誤差在2%以內,因此可以確認本論文所提供的測試方法是可行的。 | zh_TW |
dc.description.abstract | A dynamic analog test methodology using digital tester is proposed . A simple triangular waveform is built on the device interface board for the stimulus generation . The response waveform is quantized by dual comparators in a digital pin electronic circuit . Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect . The experiment results using ATE show that the error is less than 2% . It conforms the feasibility of the proposed methodology . | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 測試機 | zh_TW |
dc.subject | 類比 | zh_TW |
dc.subject | 測試技術 | zh_TW |
dc.subject | Mixed Signal IC | en_US |
dc.subject | ADC | en_US |
dc.subject | DAC | en_US |
dc.title | 使用數位測試機台進行類比動態測試技術 | zh_TW |
dc.title | Dynamic Analog Testing via ATE Digital Test Channels | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電機學院電子與光電學程 | zh_TW |
顯示於類別: | 畢業論文 |
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