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dc.contributor.author章即時en_US
dc.contributor.authorChi-Shih Changen_US
dc.contributor.author李崇仁en_US
dc.contributor.author蘇朝琴en_US
dc.contributor.authorChung-Len Leeen_US
dc.contributor.authorChau-Chin Suen_US
dc.date.accessioned2014-12-12T01:24:59Z-
dc.date.available2014-12-12T01:24:59Z-
dc.date.issued2003en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009067523en_US
dc.identifier.urihttp://hdl.handle.net/11536/41146-
dc.description.abstract本論文所提供的測試技術是利用數位測試機台來達成類比動態測試技術。在實作上,將三角波產生器加入到測試板上當做輸入信號。輸出波形利用PE電路的比較器做量化取樣。最後利用機率統計手法做分析,此方法可加強量化的解析度和降低受雜訊的影響。實作上所得到的實驗結果其誤差在2%以內,因此可以確認本論文所提供的測試方法是可行的。zh_TW
dc.description.abstractA dynamic analog test methodology using digital tester is proposed . A simple triangular waveform is built on the device interface board for the stimulus generation . The response waveform is quantized by dual comparators in a digital pin electronic circuit . Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect . The experiment results using ATE show that the error is less than 2% . It conforms the feasibility of the proposed methodology .en_US
dc.language.isozh_TWen_US
dc.subject測試機zh_TW
dc.subject類比zh_TW
dc.subject測試技術zh_TW
dc.subjectMixed Signal ICen_US
dc.subjectADCen_US
dc.subjectDACen_US
dc.title使用數位測試機台進行類比動態測試技術zh_TW
dc.titleDynamic Analog Testing via ATE Digital Test Channelsen_US
dc.typeThesisen_US
dc.contributor.department電機學院電子與光電學程zh_TW
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