完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | LEU, LY | en_US |
dc.contributor.author | LEE, CL | en_US |
dc.contributor.author | LEI, TF | en_US |
dc.contributor.author | YANG, WL | en_US |
dc.date.accessioned | 2014-12-08T15:05:39Z | - |
dc.date.available | 2014-12-08T15:05:39Z | - |
dc.date.issued | 1990-02-01 | en_US |
dc.identifier.issn | 0038-1101 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4189 | - |
dc.language.iso | en_US | en_US |
dc.title | NUMERICAL-SIMULATION OF THE VERTICAL KELVIN TEST STRUCTURE FOR SPECIFIC CONTACT RESISTIVITY | en_US |
dc.type | Article | en_US |
dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
dc.citation.volume | 33 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 177 | en_US |
dc.citation.epage | 188 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1990CQ60300003 | - |
dc.citation.woscount | 2 | - |
顯示於類別: | 期刊論文 |