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dc.contributor.authorLEU, LYen_US
dc.contributor.authorLEE, CLen_US
dc.contributor.authorLEI, TFen_US
dc.contributor.authorYANG, WLen_US
dc.date.accessioned2014-12-08T15:05:39Z-
dc.date.available2014-12-08T15:05:39Z-
dc.date.issued1990-02-01en_US
dc.identifier.issn0038-1101en_US
dc.identifier.urihttp://hdl.handle.net/11536/4189-
dc.language.isoen_USen_US
dc.titleNUMERICAL-SIMULATION OF THE VERTICAL KELVIN TEST STRUCTURE FOR SPECIFIC CONTACT RESISTIVITYen_US
dc.typeArticleen_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.citation.volume33en_US
dc.citation.issue2en_US
dc.citation.spage177en_US
dc.citation.epage188en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1990CQ60300003-
dc.citation.woscount2-
顯示於類別:期刊論文