| 標題: | EPR EVIDENCE FOR COMPENSATING DEFECTS IN BATIO3 GRAIN-BOUNDARY BARRIER LAYER CAPACITORS |
| 作者: | CHIOU, BS LIN, ST DUH, JG 電控工程研究所 Institute of Electrical and Control Engineering |
| 公開日期: | 1-Jan-1990 |
| URI: | http://hdl.handle.net/11536/4236 |
| ISSN: | 0254-0584 |
| 期刊: | MATERIALS CHEMISTRY AND PHYSICS |
| Volume: | 24 |
| Issue: | 3 |
| 起始頁: | 239 |
| 結束頁: | 245 |
| Appears in Collections: | Articles |
- Effect of MgO addition on the electrical transport properties of highly Sb-doped BaTiO3 ceramics / Chiou, BS;Wang, IH
- Effects of A/B cation ratio on the microstructure and lifetime of (Ba1-xCax)(z)(Ti0.99-y ZryMn0.01)O-3 (BCTZM) sintered in reducing atmosphere / Lee, WH;Tseng, TY;Hennings, D
- THE EFFECTS OF ND2O3 ADDITIVES AND AL2O3-SIO2-TIO2 SINTERING AIDS ON THE ELECTRICAL-RESISTIVITY OF (BA,SR)TIO3 PTCR CERAMICS / LAI, CH;WENG, CT;TSENG, TY
- Grain-boundary surface states of (Ba, Pb)TiO3 positive temperature coefficient ceramics doped with different additives and its influence on electrical properties / Chen, LF;Tseng, TY
Loading...