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DC FieldValueLanguage
dc.contributor.authorHO, JHen_US
dc.contributor.authorLEE, CLen_US
dc.contributor.authorLEI, TFen_US
dc.date.accessioned2014-12-08T15:05:46Z-
dc.date.available2014-12-08T15:05:46Z-
dc.date.issued1989-08-03en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://hdl.handle.net/11536/4310-
dc.language.isoen_USen_US
dc.titleREFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRYen_US
dc.typeArticleen_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.citation.volume25en_US
dc.citation.issue16en_US
dc.citation.spage1084en_US
dc.citation.epage1086en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1989AK81300047-
dc.citation.woscount2-
Appears in Collections:Articles


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