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dc.contributor.authorChuu, DSen_US
dc.contributor.authorChang, YCen_US
dc.contributor.authorHsieh, CYen_US
dc.date.accessioned2014-12-08T15:01:36Z-
dc.date.available2014-12-08T15:01:36Z-
dc.date.issued1997-07-30en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://hdl.handle.net/11536/431-
dc.description.abstractHigh orientation CdMnS thin films were grown on glass substrate by the pulsed laser evaporation (PLE) technique. Pulsed Nd:Yag laser was used as the evaporation source. During the deposition, various pulsed laser powers, substrate temperatures and different ratios of high purity CdS and MnS powder were used. X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive analysis of X-rays (EDAX) were employed to study the crystal structure, surface morphology and the Mn concentration of the as-deposited films. Absorption spectra were used to investigate the band gap of CdMnS films. It was found that the deviation of the band gap of CdMnS films from that of bulk CdS at room temperature depends on the concentration of Mn, The Raman spectra of our samples showed that the mixed mode behavior of transversal (longitudinal) frequency omega(T) (omega(L)) might exist in the CdMnS thin films. (C) 1997 Elsevier Science S.A.en_US
dc.language.isoen_USen_US
dc.subjectpulsed laser evaporationen_US
dc.subjectX-ray diffraction (XRD)en_US
dc.titleGrowth of CdMnS films by pulsed laser evaporationen_US
dc.typeArticleen_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume304en_US
dc.citation.issue1-2en_US
dc.citation.spage28en_US
dc.citation.epage35en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1997XV58200005-
dc.citation.woscount17-
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