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學術出版;;Publications
期刊論文;;Articles
A NEW CRITERION FOR TRANSIENT LATCHUP ANALYSIS IN BULK CMOS
A NEW CRITERION FOR TRANSIENT LATCHUP ANALYSIS IN BULK CMOS
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A1989U953200013.pdf
(708.16 KB)
Date
1989-07-01
Authors
YANG, YH
WU, CY
Journal Title
Journal ISSN
Volume Title
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DOI
10.1109/16.30939
Abstract
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Citation
URI
http://dx.doi.org/10.1109/16.30939
https://ir.lib.nycu.edu.tw/handle/11536/4338
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