Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 陳芝俞 | en_US |
dc.contributor.author | 許錫美 | en_US |
dc.date.accessioned | 2014-12-12T01:35:12Z | - |
dc.date.available | 2014-12-12T01:35:12Z | - |
dc.date.issued | 2008 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT079663527 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/43703 | - |
dc.description.abstract | 為了提供較低售價給客戶以維持產品在市場中的競爭力,半導體製造商會不斷地改善其製程來降低產品的成本。在顧及產品生命週期短暫及研發費用很高的狀況下,新製程產品通常會在相關生產資訊還不充分下就會開始量產。在新製程量產初期,新製程產品的良率是非常低且不穩定的。透過生產新製程產品可以蒐集更多關於新製程的生產資訊。 新製程取代舊製程的速率主要是取決於新製程產品良率的好壞。透過生產經驗和實驗數據來修正機台參數以提升新製程產品的良率。提升良率的兩大要素為從生產中自我的學習和透過實驗去調整機台參數的學習。這兩個要素往往決定了新製程的投料量。 本研究主要是在探討新製程導入階段在兼顧新製程需漸漸取代舊製程情形下,如何用最低的成本來滿足客戶的需求。 | zh_TW |
dc.description.abstract | For providing a competitive selling price, semiconductor manufactures continuously improve their production process to reduce manufacturing cost. A new production process is frequently introduced to the production line when its production process knowledge is ill understood for rapid product lifetime and expensive development cost. During this time, the yield of the new production process is very unstable and low. Therefore, only partial capacity is provided for the new production process for understanding its knowledge. The rate of ramp-up is influenced by yield learning of new production process. Yield in ramp-up stage is learned by two factors. One is learning by doing, the other is learning by experimentation. These two factors are generally determined by the numbers of release new production process lots. How to allocate capacity to meet customers’ demands with minimum cost is the major work in this study. We formulate a decision model to determine released lots for current and new production process during ramp-up stage to minimize total released wafer cost. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | 半導體廠 | zh_TW |
dc.subject | 良率學習 | zh_TW |
dc.subject | 投料決策 | zh_TW |
dc.subject | Semiconductor | en_US |
dc.subject | Yield learning | en_US |
dc.subject | Released lot decisions | en_US |
dc.title | 新製程導入階段投料決策模式之構建 | zh_TW |
dc.title | Released lot decisions during ramp up stage | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 管理學院工業工程與管理學程 | zh_TW |
Appears in Collections: | Thesis |