A NEW EXPERIMENTAL-METHOD TO DETERMINE THE SATURATION VOLTAGE OF A SMALL-GEOMETRY MOSFET

Full metadata record

DC Field	Value	Language
dc.contributor.author	JANG, WY	en_US
dc.contributor.author	WU, CY	en_US
dc.contributor.author	WU, HJ	en_US
dc.date.accessioned	2014-12-08T15:05:57Z	-
dc.date.available	2014-12-08T15:05:57Z	-
dc.date.issued	1988-09-01	en_US
dc.identifier.issn	0038-1101	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4489	-
dc.language.iso	en_US	en_US
dc.title	A NEW EXPERIMENTAL-METHOD TO DETERMINE THE SATURATION VOLTAGE OF A SMALL-GEOMETRY MOSFET	en_US
dc.type	Article	en_US
dc.identifier.journal	SOLID-STATE ELECTRONICS	en_US
dc.citation.volume	31	en_US
dc.citation.issue	9	en_US
dc.citation.spage	1421	en_US
dc.citation.epage	1431	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1988Q280800011	-
dc.citation.woscount	25	-
Appears in Collections:	Articles