ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	HO, JH	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	LEI, TF	en_US
dc.date.accessioned	2014-12-08T15:05:57Z	-
dc.date.available	2014-12-08T15:05:57Z	-
dc.date.issued	1988-08-01	en_US
dc.identifier.issn	0038-1101	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4501	-
dc.language.iso	en_US	en_US
dc.title	ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS	en_US
dc.type	Article	en_US
dc.identifier.journal	SOLID-STATE ELECTRONICS	en_US
dc.citation.volume	31	en_US
dc.citation.issue	8	en_US
dc.citation.spage	1321	en_US
dc.citation.epage	1326	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1988P617100015	-
dc.citation.woscount	10	-
顯示於類別：	期刊論文