Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 劉家倫 | en_US |
dc.contributor.author | 陳仁浩 | en_US |
dc.date.accessioned | 2014-12-12T01:44:55Z | - |
dc.date.available | 2014-12-12T01:44:55Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT079769527 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/46337 | - |
dc.description.abstract | 投影機產業的演變已經朝著輕巧化、可攜化的方向發展,依目前商品化的產品體積與手機相差無幾,由於攜帶方便,常因疏忽發生掉落,最常見的瑕疵就是外觀零件破裂與損壞。 本論文所研究的對象是已商品化的微型投影機,依照CNS落下試驗的規範來驗證其外觀零件的設計是否可以承受使用者不慎落下所產生的破壞。本研究係針對此現象做更進一步的探討,由外觀的缺陷來分析可能發生的原因,然後從設計端就開始著手進行強化,同時透過電腦輔助工程軟體的模擬分析做確認,再針對實際產進品進行落下試驗,最後將落下試驗結果與電腦模擬分析作比較,發現可以藉由兩種方式來改善其缺失,一是直接改變材質,選擇材料特性中破裂強度較高的原料,另一種則是設計變更,改變結構來增加其強度,並將此結果及獲得的經驗值回饋於產品開發時的設計準則,讓整體產品的品質能更近一步的提升。 | zh_TW |
dc.description.abstract | The projector industry is now developing towards lightness and portability; with the current commercialization, its product bulk is almost that of a mobile phone. But since it is easy to carry, projectors are often dropped due to carelessness; the most common defects are cracking and breakage to the cover. The subjects of study in this paper were commercialized pico-projectors. They were tested according to CNS drop test specifications to verify whether the design of its cover could withstand breakage inadvertently caused by users dropping the product. This study aimed to further explore this phenomenon and analyze the possible causes for cover defects. Strengthening began from the design end, while computer-aided engineering software simulation was used to confirm the results. Then a drop test was performed with actual products on the market, the results of which were finally compared with the computer simulation analysis results. Two methods for improvement were discovered; changing the cover material to a material with better rupture strength properties, and re-designing its structure for increased strength. The results and experience gained may be used as feedback in the design guidelines for product development, thus enhancing overall product quality further. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 落下試驗 | zh_TW |
dc.subject | 有限元素法 | zh_TW |
dc.subject | 投影機 | zh_TW |
dc.subject | Drop test | en_US |
dc.subject | Ansys LS-DYNA | en_US |
dc.subject | Projector. | en_US |
dc.title | 微投影機抗落下破壞之強度改善 | zh_TW |
dc.title | Improment of falling damage resistance of pico- projectors | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 工學院精密與自動化工程學程 | zh_TW |
Appears in Collections: | Thesis |