SPECIFIC CONTACT RESISTIVITY MEASUREMENT BY A VERTICAL KELVIN TEST STRUCTURE

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DC 欄位	值	語言
dc.contributor.author	TAN, FL	en_US
dc.contributor.author	LEU, LY	en_US
dc.contributor.author	CHUNG, LL	en_US
dc.date.accessioned	2014-12-08T15:06:04Z	-
dc.date.available	2014-12-08T15:06:04Z	-
dc.date.issued	1987-06-01	en_US
dc.identifier.issn	0018-9383	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4640	-
dc.language.iso	en_US	en_US
dc.title	SPECIFIC CONTACT RESISTIVITY MEASUREMENT BY A VERTICAL KELVIN TEST STRUCTURE	en_US
dc.type	Article	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON ELECTRON DEVICES	en_US
dc.citation.volume	34	en_US
dc.citation.issue	6	en_US
dc.citation.spage	1390	en_US
dc.citation.epage	1395	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1987H779400022	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文

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