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A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS

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1987-01-01

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10.1063/1.338820

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http://dx.doi.org/10.1063/1.338820
 https://ir.lib.nycu.edu.tw/handle/11536/4669

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期刊論文;;Articles

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