A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS

doi:10.1063/1.338820

標題:	A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS
作者:	TSENG, HH WU, CY 交大名義發表工學院 National Chiao Tung University College of Engineering
公開日期:	1-Jan-1987
URI:	http://dx.doi.org/10.1063/1.338820 http://hdl.handle.net/11536/4669
ISSN:	0021-8979
DOI:	10.1063/1.338820
期刊:	JOURNAL OF APPLIED PHYSICS
Volume:	61
Issue:	1
起始頁:	299
結束頁:	304
Appears in Collections:	Articles