A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS

doi:10.1063/1.338820

Title:	A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS
Authors:	TSENG, HH WU, CY 交大名義發表工學院 National Chiao Tung University College of Engineering
Issue Date:	1-Jan-1987
URI:	http://dx.doi.org/10.1063/1.338820 http://hdl.handle.net/11536/4669
ISSN:	0021-8979
DOI:	10.1063/1.338820
Journal:	JOURNAL OF APPLIED PHYSICS
Volume:	61
Issue:	1
Begin Page:	299
End Page:	304
Appears in Collections:	Articles