MULTIPLE STUCK-FAULT DETECTION AND LOCATION IN MULTIVALUED LINEAR CIRCUITS

Full metadata record

DC Field	Value	Language
dc.contributor.author	CHEN, CL	en_US
dc.contributor.author	DU, MW	en_US
dc.date.accessioned	2014-12-08T15:06:07Z	-
dc.date.available	2014-12-08T15:06:07Z	-
dc.date.issued	1986-12-01	en_US
dc.identifier.issn	0018-9340	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4694	-
dc.language.iso	en_US	en_US
dc.title	MULTIPLE STUCK-FAULT DETECTION AND LOCATION IN MULTIVALUED LINEAR CIRCUITS	en_US
dc.type	Letter	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON COMPUTERS	en_US
dc.citation.volume	35	en_US
dc.citation.issue	12	en_US
dc.citation.spage	1068	en_US
dc.citation.epage	1071	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1986E848200006	-
dc.citation.woscount	0	-
Appears in Collections:	Articles

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