STUDIES ON ARGON ION IMPLANT DAMAGED SILICON SURFACE BARRIERS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	CHIEN, HC	en_US
dc.contributor.author	ASHOK, S	en_US
dc.date.accessioned	2014-12-08T15:06:09Z	-
dc.date.available	2014-12-08T15:06:09Z	-
dc.date.issued	1986-09-01	en_US
dc.identifier.issn	0361-5235	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4725	-
dc.language.iso	en_US	en_US
dc.title	STUDIES ON ARGON ION IMPLANT DAMAGED SILICON SURFACE BARRIERS	en_US
dc.type	Meeting Abstract	en_US
dc.identifier.journal	JOURNAL OF ELECTRONIC MATERIALS	en_US
dc.citation.volume	15	en_US
dc.citation.issue	5	en_US
dc.citation.spage	296	en_US
dc.citation.epage	296	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1986E194800025	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文