标题: | 利用飞秒脉冲雷射制备钇钡铜氧薄膜之研究 YBa2Cu3O7-δ thin film prepared by femtosecond pulsed laser deposition |
作者: | 苏志翔 Su, Chih-Hsiang 罗志伟 Luo, Chih-Wei 电子物理系所 |
关键字: | 脉冲雷射镀膜;飞秒雷射;钇钡铜氧;薄膜;超导临界电流密度;pulsed laser deposition;femtosecond laser;YBCO;thin film;critical current density |
公开日期: | 2010 |
摘要: | 本论文第一部分系利用飞秒脉冲雷射沈积技术成长钇钡铜氧薄膜于钛酸锶(100)基板上,调变温度、氧压、雷射能量、闸门重复率、闸门开启时间等参数,比较不同条件下薄膜的品质。在最佳条件下成长的样品具有良好的超导性质与晶格结构。藉由扫描式电子显微镜以及探讨电阻-温度曲线与X-ray晶格绕射的量测结果,推测出飞秒脉冲雷射的成长机制不同于准分子脉冲雷射的混合式成长,而是奈米粒子的随机堆叠。接着测量超导临界电流来更进一步比较飞秒雷射与准分子雷射镀膜的差异。第二部分成功利用微波加热系统加热碳化矽,再对夹于其中的两片钇钡铜氧超导薄膜进行加热加压接合,接合后成功保留钇钡铜氧薄膜的超导电性,此结果显示接合钇钡铜氧超导导线的可行性,将来甚至可应用于无限长超导导线的制备。 High-Tc superconductor YBa2Cu3O7-δ (YBCO) thin films with good superconducting and crystalline properties are successfully prepared on SrTiO3 (STO) substrates by femtosecond pulsed laser deposition (fs PLD). Here we present a detail study of the YBCO thin films through varying growth parameters such as substrate temperature, O2 pressure, laser fluence, shutter repetition rate, and shutter open time. The characteristics of YBCO thin films are further examined by scanning electron microscopy, atomic force microscopy, 4-point resistance-temperature measurement, x-ray diffraction, which are compared to the YBCO thin films deposited by conventional excimer-laser-based PLD. The results suggest that the growth mechanism of fs PLD is random stacking of nano-particles rather than mixed growth in excimer-laser-based PLD. The critical current density of YBCO films was measured to further compare the properties of fs PLD and ns PLD. Second part of this thesis is that by using microwave generator to heat SiC bulk and the YBCO thin films between two SiC bulks are then heated. Finally, the two YBCO films are successfully jointed with superconductivity, which will be potentially applied to prepare the long high-Tc superconducting wires. |
URI: | http://140.113.39.130/cdrfb3/record/nctu/#GT079821515 http://hdl.handle.net/11536/47443 |
显示于类别: | Thesis |