标题: | 非晶与微晶矽氧吸收层与掺杂层在薄膜太阳能电池之特性分析与最佳化 Study of Amorphous and Microcrystalline Silicon Oxide as Absorber and Doped Layers for Thin-film Solar Cell Applications |
作者: | 曾奕文 Tseng, Yi-Wen 蔡娟娟 余沛慈 Tsai, Chuang-Chuang Yu, Pei-Chen 光电工程学系 |
关键字: | 触媒式化学气相沉积;射频电浆辅助化学气相沉积;非晶矽;非晶矽氧;微晶矽氧;Catalytic Chemical Vapor Deposition;Plasma-Enhanced Chemical Vapor Deposition;amorphous silicon;amorphous silicon oxide;microcrystalline silicon oxide |
公开日期: | 2011 |
摘要: | 本研究中使用射频电浆辅助化学气相沉积系统来沉积非晶及微晶矽氧吸收层与掺杂层,并应用于矽薄膜太阳能电池。为了有效利用太阳光谱中的各个波段,使用双接面或多接面结构可以达到增加吸收的效果。非晶矽氧薄膜由于有较大的能隙,适合作为吸收层并应用于双接面或多接面太阳能电池中来增强短波长的吸收。首先我们先研究非晶矽氧薄膜的特性及它在单接面太阳能电池中的性能,并得到最佳的转换效率为 4.43%。接下来我们将非晶矽氧吸收层应用于非晶矽氧/非晶矽锗双接面太阳能电池。随着非晶矽氧吸收层的厚度增加,短路电流密度随之增加。本文中最高的双接面太阳能电池效率为 7.38%。 此外,微晶矽氧薄膜有较大的能隙,较低的吸收系数及较高的电导,适合应用于掺杂层。然而氧的加入使得结晶率与电导同时下降。本研究中藉由调变制程参数,相较于非晶矽n型掺杂层,微晶矽氧n型掺杂层可以获得较大的能隙、较低的折射率及较高的电导。上述特性使微晶矽氧n型掺杂层与透明导电层的特性相似,因此我们将非晶单接面太阳能中的非晶n型掺杂层及透明导电层之背反射结构用微晶矽氧n型掺杂层代换,本文中最佳的非晶矽单接面太阳能电池开路电压为 900 mV,短路电流密度为 15.17 mA/cm2,填充因子为72.7%及转换效率为 9.92%。 In this study, plasma-enhanced chemical vapor deposition (PECVD) was used to deposit hydrogenated amorphous (a-SiOx:H) and microcrystalline (μc-SiOx:H) silicon oxide for thin-film solar cell applications. In order to effectively enhance the broaden spectral response, tandem or multi-junction structure was employed. The wider bandgap amorphous silicon oxide (a-SiOx:H) was a suitable absorber for the top cell. In this thesis, we first studied the characteristics of a-SiOx:H thin-films and the performance of a-SiOx:H single-junction solar cells. The optimized efficiency was 4.43%. Then we used a-SiOx:H absorber as the top cell in an a-SiOx:H/a-SiGe:H tandem solar cell. The Jsc increased and F.F. decreased with increasing in the thickness of top cell. The highest efficiency of a-SiOx:H/a-SiGe:H tandem solar cell was 7.38%. Moreover, the μc-SiOx:H with wider bandgap, lower absorption coefficient and higher conductivity was a suitable doped layers. However, the incorporation of oxygen decreased the crystalline fraction as well as the conductivity. In this study, by optimizing the deposition conditions, the μc-SiOx:H film with the higher bandgap, higher conductivity and lower refractive index than that of a-Si:H was obtained. The characteristics of μc-SiOx:H n-layer was found to be similar to transparent conductive oxide (TCO). Thus, we replaced the a-Si:H(n)/TCO back reflector by μc-SiOx:H(n) in a-Si:H single-junction solar cell. The highest efficiency of the a-Si:H single-junction solar cell was 9.92% with Voc = 900 mV, Jsc = 15.17 mA/cm2 and F.F. = 72.7%. |
URI: | http://140.113.39.130/cdrfb3/record/nctu/#GT079824540 http://hdl.handle.net/11536/47563 |
显示于类别: | Thesis |