| 標題: | RESISTANCE SWITCHING CHARACTERISTICS IN POLYCRYSTALLINE SILICON FILM RESISTORS |
| 作者: | LU, CY LU, NCC SHIH, CC 電控工程研究所 Institute of Electrical and Control Engineering |
| 公開日期: | 1985 |
| URI: | http://hdl.handle.net/11536/4811 |
| ISSN: | 0013-4651 |
| 期刊: | JOURNAL OF THE ELECTROCHEMICAL SOCIETY |
| Volume: | 132 |
| Issue: | 5 |
| 起始頁: | 1193 |
| 結束頁: | 1196 |
| 顯示於類別： | 期刊論文 |
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- ON THE RESISTANCE SWITCHING IN POLYCRYSTALLINE-SILICON RESISTORS / LU, CY;LU, NCC;SHIH, CC;LEE, MK;WANG, CS
- ON THE RESISTANCE SWITCHING IN POLYCRYSTALLINE-SILICON RESISTORS / LU, CY;LU, NCC;SHIH, CC;LEE, MK;WANG, CS
- Study on dopant activation of phosphorous implanted polycrystalline silicon thin films by KrF excimer laser annealing / Tseng, CH;Lin, CW;Teng, TH;Chang, TK;Cheng, HC
- 提升式通道結構及鍺引致再結晶複晶矽薄膜電晶體之研製 / 施俊宏;Chun-Hung Shih;葉清發;羅正忠;Ching-Fa Yeh
- Analysis of low-frequency noise in boron-doped polycrystalline silicon-germanium resistors / Chen, KM;Huang, GW;Chiu, DY;Huang, HJ;Chang, CY
- A NEW COMPUTER-AIDED SIMULATION-MODEL FOR POLYCRYSTALLINE SILICON FILM RESISTORS / WU, CY;KEN, WD
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