完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | LU, NCC | en_US |
dc.contributor.author | LU, CY | en_US |
dc.contributor.author | LEE, MK | en_US |
dc.contributor.author | SHIH, CC | en_US |
dc.contributor.author | WANG, CS | en_US |
dc.contributor.author | REUTER, W | en_US |
dc.contributor.author | SHENG, TT | en_US |
dc.date.accessioned | 2014-12-08T15:06:17Z | - |
dc.date.available | 2014-12-08T15:06:17Z | - |
dc.date.issued | 1984 | en_US |
dc.identifier.issn | 0013-4651 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4870 | - |
dc.language.iso | en_US | en_US |
dc.title | THE EFFECT OF FILM THICKNESS ON THE ELECTRICAL-PROPERTIES OF LPCVD POLYSILICON FILMS | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | en_US |
dc.citation.volume | 131 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 897 | en_US |
dc.citation.epage | 902 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1984SL25600042 | - |
dc.citation.woscount | 28 | - |
顯示於類別: | 期刊論文 |