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dc.contributor.authorLU, NCCen_US
dc.contributor.authorLU, CYen_US
dc.contributor.authorLEE, MKen_US
dc.contributor.authorSHIH, CCen_US
dc.contributor.authorWANG, CSen_US
dc.contributor.authorREUTER, Wen_US
dc.contributor.authorSHENG, TTen_US
dc.date.accessioned2014-12-08T15:06:17Z-
dc.date.available2014-12-08T15:06:17Z-
dc.date.issued1984en_US
dc.identifier.issn0013-4651en_US
dc.identifier.urihttp://hdl.handle.net/11536/4870-
dc.language.isoen_USen_US
dc.titleTHE EFFECT OF FILM THICKNESS ON THE ELECTRICAL-PROPERTIES OF LPCVD POLYSILICON FILMSen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.citation.volume131en_US
dc.citation.issue4en_US
dc.citation.spage897en_US
dc.citation.epage902en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1984SL25600042-
dc.citation.woscount28-
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