標題: 配向膜離子電荷殘留對In Plane Switching LCD之殘影與閃爍的研究
Study of Image Sticking and Flicker of In Plane Switching LCD by Accumulated Charges on Polyimide Alignment Film
作者: 鍾清暉
Chung, Ching-Hui
林宏洲
Lin, Hong-Cheu
平面顯示技術碩士學位學程
關鍵字: 影像殘留;畫面閃爍;配向膜;離子電荷;電壓保持率;Image sticking;Flicker;Polyimide;Ion density;Voltage Holding ratio
公開日期: 2012
摘要: 近年來液晶顯示器產業迅速的發展,隨著低電壓驅動以及高速應答液晶顯示器元件的開發,有一需要克服的難題就是液晶cell中的離子電荷效應,這些離子電荷的來源可能是液晶、配向膜、框膠、間隙物等材料,也可能是在製作液晶cell的過程中所產生,這些離子電荷的存在,造成配向膜內部殘留直流電壓的增加而影響顯示品質。 本論文研究內容,針對日產化學提供的兩種配向膜離子電荷殘留對於In plane Switching LCD顯示品質的影響,希望藉由配向膜材料特性觀察其釋放離子電荷的能力,了解PI配向膜材料內部殘餘直流電壓對於液晶cell光學特性的變化如:離子電荷﹙Ion density﹚、電壓保持率﹙Voltage Holding ratio﹚、畫面閃爍﹙Flicker﹚、影像殘留﹙Image sticking﹚等等。
With the prosperous development of the liquid crystal display, although the application of low-voltage drives and high-speed responding components improve, the issue of the electronic effect within cells has to been solved. As can be seen, the origin of the electrons may come from liquid crystal, PI, seal and space. However, the electrons may generate under the processes of liquid crystal display. Therefore, the existence of these electrons lead to the rise of direct current, and then curb the quality of display. The gist of this study focuses on the influences of two residual electrons from PI which are provided by Nissan , especially on In plane Switching LCD. By scrutinizing the ability of releasing electrons from PI, the horizons on the changes of cell’s optical attributes are expected to expand, such as Ion density, voltage Holding ratio, flicker and Image sticking, which is affected by residual direct current of internal.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT079887525
http://hdl.handle.net/11536/48905
顯示於類別:畢業論文


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