THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS

Full metadata record

DC Field	Value	Language
dc.contributor.author	LIU, YN	en_US
dc.contributor.author	LIU, CC	en_US
dc.date.accessioned	2014-12-08T15:06:23Z	-
dc.date.available	2014-12-08T15:06:23Z	-
dc.date.issued	1982-01-01	en_US
dc.identifier.issn	0018-9367	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4953	-
dc.description.abstract		en_US
dc.language.iso	en_US	en_US
dc.title	THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS	en_US
dc.type	Article	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON ELECTRICAL INSULATION	en_US
dc.citation.volume	17	en_US
dc.citation.issue	1	en_US
dc.citation.spage	20	en_US
dc.citation.epage	26	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
Appears in Collections:	Articles

APA	LIU, Y., & LIU, C. (1982). THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS. IEEE TRANSACTIONS ON ELECTRICAL INSULATION.
Bibtex	@article{LIU1982THE, title={THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS}, author={LIU, YN and LIU, CC}, journal={IEEE TRANSACTIONS ON ELECTRICAL INSULATION}, year={1982}, url={https://ir.lib.nycu.edu.tw/handle/11536/4953?mode=full}, }