Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | WU, CY | en_US |
dc.contributor.author | KING, CW | en_US |
dc.contributor.author | LEE, MK | en_US |
dc.contributor.author | CHEN, CT | en_US |
dc.date.accessioned | 2014-12-08T15:06:23Z | - |
dc.date.available | 2014-12-08T15:06:23Z | - |
dc.date.issued | 1982 | en_US |
dc.identifier.issn | 0013-4651 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4955 | - |
dc.language.iso | en_US | en_US |
dc.title | GROWTH-KINETICS OF SILICON THERMAL NITRIDATION | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | en_US |
dc.citation.volume | 129 | en_US |
dc.citation.issue | 7 | en_US |
dc.citation.spage | 1559 | en_US |
dc.citation.epage | 1563 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1982NW36700032 | - |
dc.citation.woscount | 41 | - |
Appears in Collections: | Articles |
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