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dc.contributor.author趙守敬en_US
dc.contributor.authorChao, Shio-Jingen_US
dc.contributor.author陳方中en_US
dc.contributor.authoren_US
dc.contributor.author田仲豪en_US
dc.contributor.authorChen, Fang-Chungen_US
dc.contributor.authoren_US
dc.contributor.authorTien, Chung-Haoen_US
dc.date.accessioned2014-12-12T01:57:41Z-
dc.date.available2014-12-12T01:57:41Z-
dc.date.issued2012en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT079924523en_US
dc.identifier.urihttp://hdl.handle.net/11536/49804-
dc.description.abstract本研究利用四駢環類的材料為有機主動層材料、聚乙烯醇肉桂酸酯為有機介電層材料,以金為電極製做出頂電極結構之有機薄膜電晶體,我們發現經由成長後退火處理可以提高元件之載子遷移率表現,進而去研究載子遷移率上升的原因,我們發現成長後退火會改變主動層的結晶型態、表面形態以及降低了利用轉換線法所萃取之接觸電阻。本實驗最佳化條件其電流關關比可至3.8x103,載子遷移率可達0.092 cm2/Vs。zh_TW
dc.description.abstractIn this study, we fabricated top contact organic thin film transistors with poly(2,5-bis(thiophene-2-yl)-(3,7-ditri-decanyltetrathienoacene) as active layer. The dielectric layer and source/drain electrodes were fabricated with poly(vinyl cinnamate)(PVCN) and Au, respectively. We found that the device performance were improved apparently after post-annealing. We realized that post-annealing could change the polymer morphology and improve the crystallization of the active layer. The contact resistances, which were extracted following the transfer-line method, were reduced after post-annealing. The optimized device exhibited a mobility of 0.092 cm2/Vs and an on-off ratio of 3.8x103.en_US
dc.language.isozh_TWen_US
dc.subject成長後退火zh_TW
dc.subject載子遷移率zh_TW
dc.subjectPost-annealingen_US
dc.subjectmobilityen_US
dc.title成長後退火對有機薄膜電晶體之電性影響探討zh_TW
dc.titlePost-Annealing Effect on the Performance of Organic Thin-Film Transistorsen_US
dc.typeThesisen_US
dc.contributor.department光電工程學系zh_TW
Appears in Collections:Thesis