CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	LU, NCC	en_US
dc.contributor.author	LU, CY	en_US
dc.contributor.author	LEE, MK	en_US
dc.contributor.author	SHIH, CC	en_US
dc.contributor.author	WANG, CS	en_US
dc.contributor.author	SHENG, TT	en_US
dc.contributor.author	REUTER, W	en_US
dc.date.accessioned	2014-12-08T15:06:25Z	-
dc.date.available	2014-12-08T15:06:25Z	-
dc.date.issued	1982	en_US
dc.identifier.issn	0013-4651	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4986	-
dc.language.iso	en_US	en_US
dc.title	CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS	en_US
dc.type	Meeting Abstract	en_US
dc.identifier.journal	JOURNAL OF THE ELECTROCHEMICAL SOCIETY	en_US
dc.citation.volume	129	en_US
dc.citation.issue	8	en_US
dc.citation.spage	C331	en_US
dc.citation.epage	C331	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.identifier.wosnumber	WOS:A1982PA69100286	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文