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Issue DateTitleAuthor(s)
1-Aug-2010Particular Failure Mechanism of GaN-Based Alternating Current Light-Emitting Diode Induced by GaOx OxidationYen, Hsi-Hsuan; Kuo, Hao-Chung; Yeh, Wen-Yung; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
1-Jul-2010A High-Performance 30-nm Gate-All-Around Poly-Si Nanowire Thin-Film Transistor With NH3 Plasma TreatmentLee, Chen-Ming; Tsui, Bing-Yue; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-Jun-2010Transition of stable rectification to resistive-switching in Ti/TiO2/Pt oxide diodeHuang, Jiun-Jia; Kuo, Chih-Wei; Chang, Wei-Chen; Hou, Tuo-Hung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2013Electrodeless dielectrophoretic concentrator for analyte pre-concentration on poly-silicon nanowire field effect transistorPuttaswamy, Srinivasu Valagerahally; Lin, Chih-Heng; Sivashankar, Shilpa; Yang, Yuh-Shyong; Liu, Cheng-Hsien; 生物科技學院; College of Biological Science and Technology
21-Sep-2010Time-dependent density functional theory for quantum transportZheng, Xiao; Chen, GuanHua; Mo, Yan; Koo, SiuKong; Tian, Heng; Yam, ChiYung; Yan, YiJing; 應用化學系; Department of Applied Chemistry
1-Jul-2012Pancyclicity, Panconnectivity, and Panpositionability for General Graphs and Bipartite GraphsKao, Shin-Shin; Lin, Cheng-Kuan; Huang, Hua-Min; Hsu, Lih-Hsing; 資訊工程學系; Department of Computer Science
1-Mar-2019Application of IR spectra of two successive isotope labeled residues to the evaluation of dihedral angles of polyproline II structureMiyata, Daisuke; Hiramatsu, Hirotsugu; Nakabayashi, Takakazu; 交大名義發表; 應用化學系; 應用化學系分子科學碩博班; National Chiao Tung University; Department of Applied Chemistry; Institute of Molecular science
1-Nov-2018Broadband UV-assisted thermal annealing of low-k silicon carbonitride films using a C-rich silazane precursorChang, Wei-Yuan; Chung, Hau-Ting; Chen, Yi-Chang; Leu, Jihperng; 材料科學與工程學系; Department of Materials Science and Engineering
1-Oct-2010Yang and Yin parameters in the Lorenz systemGe, Zheng-Ming; Li, Shih-Yu; 機械工程學系; Department of Mechanical Engineering
1-Aug-2012Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic CircuitsFan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics

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