THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE

標題:	THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE
作者:	YU, SY 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1981
URI:	http://hdl.handle.net/11536/5025
ISSN:	0038-1101
期刊:	SOLID-STATE ELECTRONICS
Volume:	24
Issue:	8
起始頁:	725
結束頁:	729
Appears in Collections:	Articles