THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	YU, SY	en_US
dc.date.accessioned	2014-12-08T15:06:27Z	-
dc.date.available	2014-12-08T15:06:27Z	-
dc.date.issued	1981	en_US
dc.identifier.issn	0038-1101	en_US
dc.identifier.uri	http://hdl.handle.net/11536/5025	-
dc.language.iso	en_US	en_US
dc.title	THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE	en_US
dc.type	Article	en_US
dc.identifier.journal	SOLID-STATE ELECTRONICS	en_US
dc.citation.volume	24	en_US
dc.citation.issue	8	en_US
dc.citation.spage	725	en_US
dc.citation.epage	729	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1981LY15400005	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文