標題: THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE
作者: YU, SY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1981
URI: http://hdl.handle.net/11536/5025
ISSN: 0038-1101
期刊: SOLID-STATE ELECTRONICS
Volume: 24
Issue: 8
起始頁: 725
結束頁: 729
顯示於類別:期刊論文